Original price was: $852.95.$170.59Current price is: $170.59.
Free shipping on orders over $49
Guaranteed safe checkout
DESCRIPTION The TGTZ-400 test grating is intended for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle:
About 50 degrees Tip Radius:
≤10nm Tip Height:
0.3 – 0.7µm Period: 3 ±0.01µm Diagonal period: 2.12µm Chip size: 5 x 5 x 0.5mm Effective area: Central square of 2 x 2mm
| Select | Test grating TGTZ-400, 300-700nm tips, unmounted, Test grating TGTZ-400, 300-700nm tips, mounted on 12mm AFM disc |
|---|
A concise product review has not been added yet. Product claims, compatibility and contents should be reviewed before publishing.
Unopened products may be returned within 30 days of delivery. Items must be unused, in original packaging and accompanied by proof of purchase. For hygiene and safety reasons, opened consumables cannot be returned. Contact support before sending a return.
Orders are typically dispatched within 1-2 business days. Delivery is available across the United States with tracked service. Orders over $49 qualify for free standard shipping. Delivery estimates begin after the order leaves our warehouse and may vary by destination.
