Description
Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Silicon Nitride AFM Probe with 2 Different Cantilevers on Each Side of the Chip This competitively priced silicon nitride AFM probe features: 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
silicon nitride wedge tip
overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
macroscopic half cone angle of 35° 450 micron thick silicon holder chip AFM Tip SHAPE
Pyramid Tip Height
12µm – From 10µm To 14µm Tip Radius < 15nm Half Cone Angle
35° (macroscopic) Cantilever A – Contact Mode
Cantilever B – Force Modulation Shape
Triangle
Shape
Beam Force Constant
0.27
Force Constant
0.06N/m Resonance Frequency
30kHz
Resonance Frequency
10kHz Length 100µm – From 90µm To 110µm Length 200µm – From 190µm To 210µm Width 16µm – From 11µm To 21µm Width 30µm – From 25µm To 35µm Thickness 0.52µm – From 0.47µm To 0.57µm Thickness 0.52µm – From 0.47µm To 0.57µm
