Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs Larger FIB grid holder capable of holding multiple FIB grids of the same thickness. Can also be used to safely store FIB grids with thin section (lamellae) attached to them. Brass thumbscrews facilitate easy loading and unloading. Overall dimensions 22.5 x 29 x 13.5mm (7/8″ x 1-1/8″ x 5/8″). Standard 3.2mm (1/8″) pin. Material: vacuum grade aluminum with brass thumbscrews. Screw used is 4-40 x 3/8, Thumb, Brass
