Description
DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nanomechanics Probe, 350 N/m, 750kHz, 10nm ROC, 5-Pack. Uncalibrated.These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam. Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance. Tip Geometry:
Standard Tip Height:
12.5 +/- 2.5 Front Angle:
25+/-5 Back Angle:
15+/-5 Side Angle:
22.5+/-5 Tip Radius (Nom):
10 Tip Set Back(Nom):
15-25 Tilt Compensation:
2 +/- 1 Cantilever Material:
Diamond nmech probe, 150N/M, UNCALIBRATED, 5PK Cantilever Thickness (Nom):
4 Cantilever Thickness (RNG):
3.5-4.5 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Back Side Coating:
Reflective Au
