Description
Electrical, Tapping Mode AFM Probe DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Electrical, Tapping Mode AFM Probe Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM)
electrostatic force microscopy (EFM)
Kelvin probe force microscopy (KFM)
scanning probe lithography The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip SHAPE
Rotated Tip Height
17µm From 15µm To 19µm Tip Setback
15µm From 10µm To 20µm Tip Radius < 25nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
40N/m – From 20N/m To 75N/m Resonance Frequency
300kHz – From 200kHz To 400kHz Length 125µm – From 115µm To 135µm Width 30µm – From 25µm To 35µm Thickness 4µm – From 3µm To 5µm
