Description
Gold Coated and Soft Tapping Mode AFM Probe DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Gold Coated Soft Tapping Mode AFM Probe Monolithic silicon AFM probe for soft tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not recommended for electric applications on abrasive sample surfaces! AFM Tip SHAPE
Rotated Tip Height
17µm – From 15µm To 19µm Tip Setback
15µm – From 10µm To 20µm Tip Radius < 25nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
5N/m – From 1.5N/m To 15N/m Resonance Frequency
150kHz – From 75kHz To 225kHz Length 125µm – From 115µm To 135µm Width 25µm – From 20µm To 30µm Thickness 2.1µm – From 1.1µm To 3.1µm
