Description
Sharpened, 6 levers, 0.01-0.50N/m, Au Reflex Coating DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Bruker’s sharpened Microlever AFM probes have soft Silicon Nitride cantileverswith sharpened Silicon Nitride tips, and are ideal for contact imaging modes,force modulation microscopy, and liquid operation. The range in forceconstants enables users to image extremely soft samples in contact modeas well as high load vs distance spectroscopy. Each unmounted probe comes with six different cantilevers of variousdimensions, resulting in six unique nominal values for force constantand resonant frequency. The MSCT cantilever layout consists of an “A”cantilevers on one side of the probe, and “B,” “C,” “D,” “E,” and “F”cantilevers on the other side of the probe. See the cantilever orientation diagram here. All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend. For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10. Tip Geometry:
Rotated (Symmetric) Tip Height:
2.5 – 8.0 Front Angle:
15 ± 2.5 Back Angle:
25 ± 2.5 Side Angle:
17.5 ± 2.5 Tip Radius (Nom):
10 Tip Radius (Max):
40 Tip Set Back (Nom):
4 Tip Set Back( RNG):
0 – 7 Cantilever Material:
Silicon Nitride Cantilever Thickness (Nom):
0.55 Cantilever Thickness (RNG):
0.5 – 0.6 Cantilever Geometry: Rectangular & Triangular Cantilevers Number:
6 Back Side Coating:
Reflective Gold
