Description
DESCRIPTION Selection of 3 block type test gratings with different step heights intended for Z-axis calibration of scanning probe microscopes and linearity measurements. Structure: Si Wafer with SiO2 layer for grating Pattern type: 1-Dimensional (in Z-axis direction) Step heights: 20±1.5nm for TGZ-20 110±2nm for TGZ-100 520±3nm for TGZ-500 Period: 3 ±0.01µm Chip size: 5 x 5 x 0.5mm Effective area: Central square of 3 x 3mm Note: Values for step heights are nominal; actual step height is given with the product and could be ±5%
CategoryVape
BrandVape Willow
SKUPRD-E93C452B7699
Global identifierNot provided
Identifier typeNot provided
Manufacturer part numberNot provided
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